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Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features
Applications for the PELCO® Pro Gold Plated Tweezers include microelectronics
Clean and sharp lines
Material Code Copper C Nickel N Gold G Aluminum A Molybdenum M Titanium T Stainless Steel S
Critical Dimension (CD) Calibration Test Specimens for SEM, FIB, and AFM Type:Non-Certified Bruker's new platinum silicide AFMDESCRIPTION "Critical Dimension (CD) structures" are particularly useful for SEM FIB magnification calibration and may be used for AFM. Microscopists and engineers using high performance SEMs or FIB systems will find this calibration test specimen useful. The 4. 8 x 4. 8mm silicon standard has a series of patterns with a side length of 480m around its edges, helpful for orientation. There are three versions available. Version with a 10 5 2 1 0. 5um
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