PELCO® 35nm Silicon Nitride Support Films for TEM Rotated Included with MultiMode CAFM

Included with MultiMode CAFM

the next level in a series of magnification calibration standards (the MRS-1

Veco grids are available in different styles with square

The PELCO® Pro Superalloy

PELCO® 35nm Silicon Nitride Support Films for TEM Rotated Included with MultiMode CAFMDESCRIPTION PRODUCT SPECIFICATIONS 35nm membrane thickness 25 apertures 200m frame thickness 21515 10 Silicon Nitride Support Film, 35nm, 70x70m Aperture (25) on 0. 5 x 0. 5mm Window pkg 10 Defining parameters for the PELCO Silicon Nitride Support Films are: Film Thickness: Resilient, ultra low stress 8, 15, 35 or 50nm giving rise to minimum absorption to enable clear imaging; robust, low stress 200nm for better handling and use on multiple platforms;