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Surface and interface science
High resolution electrical imaging with an ultra-sharp conductive tip
*The MTM-10 High Resolution Thickness Monitor System includes: MTM Controller Box
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ElectriAll-In-One 22 kHz Surface and interface scienceElectrical AFM Probe with 4 Different Cantilevers DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Electrical AFM Probe with 4 Different Cantilevers Versatile monolithic silicon AFM probe with 4 different platinum coated cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping non contact mode and electric modes such as: scanning capacitance microscopy
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