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Z-movement and maximum specimen height provided by the specimen stage in the SEM
The step height corresponds to the half of the lattice constant of the 6H-SiC crystal in the (0001) direction
excellent thermal stability
Thickness of Mo grids is typically 25µm - 50µm
38° Pin Stub Holder FEI FIB Pre-Tilt PELCO® Grids Z-movement and maximum specimen heightDESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain
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