MagneticMulti75-G Wafer It also holds two FIB

It also holds two FIB grids conveniently close to the sample to mount and prepare TEM lamellae on the FIB grid for subsequent TEM imaging

low carbon stainless steel

5418-5 - Set of 5 PELCO® SV ESD Safe

Magnification Reference Standard & Stage Micrometer

MagneticMulti75-G Wafer It also holds two FIBHard Magnetic, Medium Momentum AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Hard Magnetic, Medium Momentum AFM Probe Monolithic silicon AFM probe for magnetic force microscopy (MFM). The cobalt alloy coated tip has a magnetic moment of roughly 10^ 13 emu and coercivity of roughly 300 Oe. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and